It is a functional and miniaturized desktop X-ray diffractometer system, enriched advanced technology of traditional diffractometer,which is designed for industrial production and quality control. It can get accurate qualitative and crystal structure analysis of metal and nonmetal samples. Especially suitable for catalyzer, titanium dioxide, cement, pharmacy and other manufacturing industry.
Parameter
| Rating power (tube voltage, tube current): 600W (40kV, 15mA) or 1200W (40kV,30mA), stability degree: | 600W (40kV, 15mA) or 1200W (40kV,30mA), stability degree: 0.005% |
| X-ray tube: Metal ceramic X ray tube, target material: | Cu, power:2.4kW, focus size: 1×10mm; air cooling or water cooling (flaw>2.5L/min) |
| Goniometer: Sample level θs-θd,radius of diffraction: | 150mm |
| Scanning fashion: | Continuous, stepping and Omg |
| Angle scanning range: | θs / θd dlinkage /single action: -3° -150° |
| Minimal stepping wide: | 0.0001° |
| Angle repeatable accuracy： | 0.0005° |
| Angle locating speed: | 1500°/min |
| Counter: | Closed proportional counters or High speed one-dimensional semiconductor counter |
| Maximal counting rate of linearity: | ≥ 5 × 105CPS (Proportional), ≤9×107CPS(one-dimensional semiconductor) |
| Computer: | DELL business notebook |
| Radiation protection: | Lead and glass cabinet, irradiation safety is better than 1μSv/h |
| Integrated stability: | ≤1‰ |
| Figure size: | 600 × 410 × 670(w × d × h)mm |
| Instrument control software: | Windows7；tube current, tube voltage and optical shutter can automatically control the X-ray generator; X-ray tube aging training；step or Omg scanning can be controlled to collect data at the same time |
| Data processing: | Automatical and manual peak-seaking, integrated intensity, peak height, weight, background subtraction, smooth, peak amplification, profile comparison, etc. |
| Data processing software: | Qualitative phase; quantitative analysis; Kα1, α2 stripping; full spectrum fitting; cyclone fitting; calculation of half peak width and grain size; unit cell determination; two types of stress calculation; diffraction line indexing; multiple drawing; 3D drawing; diffraction data calibration; background subtraction; standard-less quantitative analysis; WPF; XRD; diffraction pattern simulating |
| Data processing software: | Qualitative phase; quantitative analysis; Kα1, α2 stripping; full spectrum fitting; cyclone fitting; calculation of half peak width and grain size; unit cell determination; two types of stress calculation; diffraction line indexing; multiple drawing; 3D drawing; diffraction data calibration; background subtraction; standard-less quantitative analysis; WPF; XRD; diffraction pattern simulating. |
