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Double-Ended Pogo Pins Test Probes SCFB029 (40) for Chip Inspection
Double-Ended Pogo Pins Test Probes SCFB029 (40) for Chip Inspection
FOB Price 0.1 - 50 USD / Piece
MOQ
100 Piece
Port
Hong Kong
Lead Time
about ten working days
Hong Kong
Main Products : semiconductor test probe, in-circuit test probe, switching probe, interface probe, battery contact probe, big current probe, harness probe, radio frequency prob
Room B, 4/F, Good Luck Industrial Building, 105 How Ming Street, Kwun Tong, Kowloon, Hong Kong. Hong Kong, Hong Kong
Double-Ended Pogo Pins Test Probes SCFB029 (40) for Chip Inspection Details
Brand Name
Centalic
Model Number
SCPB029(40)-XX-57-0.5GG(BS)
Place of Origin
China
Supply Type
In-Stock Items
Condition
New
Color
Gold
Double-Ended Pogo Pins Test Probes SCFB029 (40) for Chip Inspection Introduce

Double-Ended Pogo Pin Test Probe SCFB029 (40) for Chip Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

SCPB029(40) is unique in shape among semiconductor test probes due to a convex ring at one end of its barrel. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. Its parameters are as below.

Materials (plated)

Barrel Ph, Au on Ni Plated
Bottom Plunger BeCu, Au on Ni Plated
Top Plunger SK4, Au on Ni Plated
Spring SWP-A/B, Au on Ni Plated

Electronic Specification:

Current Rating 2 amps
Contact Resistance 100 milliohms max
Bandwidth 8.5 GHz at -1dB
Inductance 1MHZ at -0.02661uH
Captance 1MHZ at 0.925374uF

Specifications:

Full Stroke 1 mm
Rated Stroke 0.65 mm
Spring Force 14±4 gf at load 0.65 mm
Mechanical Life about 100000 cycles

For more information, please check below catalog.

Company Information:

Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:

Stock: standard product. As usual, they are in stock.

Express: DHL, FedEx, UPS, etc.

Payment: T/T, PayPal

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