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Interface Probes Test Pins IFP-001 Used for Transmitting Electrical Signals
Interface Probes Test Pins IFP-001 Used for Transmitting Electrical Signals
FOB Price 0.1 - 50 USD / Piece
MOQ
100 Piece
Port
Hong Kong
Lead Time
about ten working days
Hong Kong
Main Products : semiconductor test probe, in-circuit test probe, switching probe, interface probe, battery contact probe, big current probe, harness probe, radio frequency prob
Room B, 4/F, Good Luck Industrial Building, 105 How Ming Street, Kwun Tong, Kowloon, Hong Kong. Hong Kong, Hong Kong
Interface Probes Test Pins IFP-001 Used for Transmitting Electrical Signals Details
Brand Name
Centalic
Model Number
IFP-001
Place of Origin
China
Supply Type
In-Stock Items
Condition
New
Color
Gold
Interface Probes Test Pins IFP-001 Used for Transmitting Electrical Signals Introduce

Interface Probe Test Pin IFP-001 Used for Transmitting Electrical Signals

Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures.

Interface probes manufactured by Centalic mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-001, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests.

IFP-001 interface probe is 14.22 mm in total length. If customers wish to change its length or diameter, we could do as required. This probe is unique in shape. It is straight whereas others, for example 002, 003, 004, 005, 006, 007, have an extra base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome.

For more information, please check below catalog.

Company Information

Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:

Stock: standard product. As usual, they are in stock.

Express: DHL, FedEx, UPS, etc.

Payment: T/T, PayPal

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