Niton XL3t Series analyzers provide many distinct advantages: - Very easy to use – even by non-technical personnel - Lab-quality performance in a handheld instrument - Improved cycle time for high sample throughput Featuring a high-performance thermoelectrically cooled detector, 80 MHz real-time digital signal processing, and dual state-of-the-art embedded processors for computation, data storage, communication, and other functions, the Niton XL3t incorporates many new features directly benefiing the customer. From the integrated, tilting, color, touchscreen display to the customizable menus for ease of use, these ergonomic new analyzers are both the lightest weight and most ruggedly constructed x-ray tube-sourced handheld XRF analyzers ever made. Niton XL3t instruments can be used for many nondestructive testing applications, including analysis of metal alloys, screening of electronics and consumer goods for prohibited substances, mining exploration and grade control, and more. For example, the Thermo Scientific Niton XL3t 800 Series is the defiitive tool for scrap metal recycling, casting and fabrication, manufacturing and Positive Material Identifiation (PMI). Alloy grade ID and QC testing typically take 1 to 2 seconds, with accurate alloy chemistry in as little as 3 to 5 seconds. Similarly, compliance testing for meeting the demands set forth in the Consumer Product Safety Improvement Act (CPSIA), Proposition 65, Restriction of Hazardous Substances (RoHS), and other regulations is faster than ever before with the Niton XL3t 700 Series, including screening of incoming materials, stocks and outgoing fiished goods. Detection limits for all banned substances are improved – especially for cadmium – with the 50 kV x-ray tube sample excitation system. The Niton XL3t’s analytical power alone puts it in a fild by itself. With its many standard features and available options, it stands far above the competition. Integrated USB and Bluetooth™ communications provide direct data transfer to the user’s PC or networked storage device, eliminating cumbersome data syncing procedures required by PDA-based XRF analyzers. A clip-on weld mask and folding test stand help users safely analyze diffiult to measure samples. Additionally, the optional heat shield extends the hot-surface testing capability from 600ºF (315ºC) to 1,000ºF (538ºC), protecting both the analyzer and the operator’s hand from these elevated temperatures. Add the optional integrated sample imaging system and 3 mm small spot feature to locate areas of interest in a sample, such as a small component or button, then store the image of each sample analyzed along with measurement results; or choose the Helium Purge Light Element Analysis Package for direct analysis of Mg, Al, Si, and P