AL-2700 series diffractometer is designed for material research and industrial product analysis,and it is a perfect product which combines the conventional analysis and special purpose measurement.
* The perfect combining with hardware and software system, satisfy with the requirement of different application field academician, scientific research.
* High precision diffraction angle measuring system, obtaining more accurate measurement results.
* High stability X-ray generator control system, and get more stable repeatable measurement precision.
* Various functional accessories meet the requirement of different testing purposes.
* Program operation, integrated structure design, easy to operate, more beautiful appearance of the instrument;
* X-ray diffractometer is a kind of universal testing instrument for revealing crystal structure and chemical information of material:
* One and many phase identification of unknown sample
* Quantitative analysis of the phase in the mixed sample
* Crystal structure analysis ( Rietveld structure analysis)
* The crystal structure change (high temperature and low temperature condition) of the abnormal condition.
* Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density.
* Analysis of micro area sample.
* Texture and stress analysis of metallic materials
| Al-2700A | AL-2700B | |
| Rated power | 3kW(HF, HV control technology) | 4kW |
| Tube voltage | 10~60kV | |
| Tube current | 5~50mA | 5~80mA |
| X-ray tube | Metal ceramic tube Target material: Cu､Fe､Co､Cr､Mo, etc Power:2.4kW | |
| Focus size | 1×10mm or 0.4×14mm or 2×12mm | |
| Stability | ≤0.005% | ≤0.01% |
| Goniometer structure | Sample level(θ~θ) | |
| Radius of diffraction | 225mm(or custom by request:150~285mmrange) | |
| 2θ Scanning range | ﹣6~160°(θs:﹣3~80°､θd:﹣3~80°) | |
| Scanning speed | 0.0012°~50°/min | |
| Angle locating speed | 1500°/min | |
| Scanning fashion | θs/ θd linkage /single acting; continuous, stepping and Omg | |
| Minimal stepping angle | 1/10000° | |
| Angle repeatable accuracy | 1/10000° | |
| 2θ Angular linearity | International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02° | |
| Detector | Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector | |
| Maximal counting rate of linearity | 5×105CPS(PC､SC with the compensate function of miss counting)､15×104CPS (SDD)､9×107CPS(one-dimensional array) | |
| Energy resolution ratio | ≤25%(PC､one-dimensional array)､≤50%(SC)､≤200eV(SDD) | |
| Counting fashion | differential coefficient or integral, PHA automatically, dead time regulate | |
| Stability of system measure | ≤0.01% | |
| Scattered rays dose | ≤1μSv/h(without X-ray protective device) | |
| Instrument integrative stability | ≤0.1% | ≤0.5% |
| Figure size | 1000×800×1600mm | |
